The thickness of photoresist applied towafers in a semiconductor manufacturing at a particular location onthe wafer is uniformly distributed between 0.2050 and 0.2150micrometers.(a) Determine the cumulative distributionfunction of photoresist thickness.(b) Determine the proportion of wafers that exceeds0.2125 micrometers in photoresist thickness.(c) What thickness is exceeded by 10% of thewafers?(d) Determine the mean and variance of photoresistthickness.

a

b

c

d

Mean

Variance  

Step-by-step explanation:

From the question we are told that

   The thickness of photoresist follows a uniform distribution

So

Generally the probability density function  is mathematically represented as

=>  

Generally the cumulative distribution function is

Here means the lower limit which in this case is  02050

So

=>  

=>  

Generally the proportion of wafers that exceeds 0.2125 is mathematically represented as

=>  

=>  

Generally the thickness which is exceeded by 10% of the wafers is mathematically represented as

=>    

=>    

=>    

=>  

=>  

Generally the mean is mathematically represented as  

=>  

Generally the variance  is mathematically represented as

=>  

i think it's ф or x=6,-6

step-by-step explanation:

-x^2=-36

x^2=-36

ф

or

if you mean by : -(x^2)=-36

it'll be: x^2=36

x=6,x=-6

hope it'll ! have a good day!

you for asking!

options a,b,c are the right answer.

step-by-step explanation:

a linear parent function is always represented as y = x

if we write this function in the form of y=mx+c

⇒

or  

now if we plot a graph we will find these characteristics:

1) y intercept of the graph is zero so its a straight line passing through origin.

2) as we can see in both the forms of function written, values of x and y may be either positive or negative for the positive slope means points on the graph are either in first quadrant or in third one.

3) it's slope is one.