Please answer the question.

Slip occurs via two partial dislocations because of (a) the shorter path of the partial dislocation lines; (b) the lower energy state through partial dislocations; (c) the charge balance.

The proportional limit is always greater than the yield strength for a material. a)-trune b)- false

What is the chief metrological difference between measuring with a microscope and with an electronic comparator? a. the microscope is limited to small workpieces.a. the microscope is limited to small workpieces. c. the comparator can only examine one point on the workpiece. d. the microscope carries its own standard.