When a chip fabrication facility is operating normally, the lifetime of a microchip operated at temperature t, measured in degrees celsius, is given by an exponential (lambda) random variable x with expected value e[x] =1/lambda = (400/t)^2 years. occasionally, the chip fabrication plant has contamination problems and the chips tend to fail much more rapidly. to test for contamination problems, each day m chips are subjected to a one-day test at t = 100 degree c. based on n, the number of chips that fail in one day, design a significance test for the null hypothesis h_o: the plant is operating normally. (a) suppose the rejection set of the test is r = {n > 0}. find the significance level of the test as a function of m, the number of chips tested. alpha(m) = (b) at temperature 100 degree celsius, how many chips must be tested so that the significance level is alpha = 0.1? m= note that m must be an integer. (c) if we raise the temperature during the test, the number of chips we need to test will .