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Find the value of the variable and the length of each secant segment.

The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to

Which number completes the system of linear inequalities represented by the graph? y> 2x – 2 and x + 4y 2 et 2 3 4