In AUVW, UW is extended through point W to point X, mZUVW = (3x + 16)°, mZWUV = (2x + 8)°, and
m/VWX (82 – 18)°. Find mZWUV.
=

The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to

How do the number line graphs of the solutions sets of -23 > x and x-23 differ?

Angles r and s are complementary. the measure of angle r is 31 degrees. which equation can be used to find angle s?