Your internship at a microelectronics firm involves the development of a diagnostic chip that uses a precisely calibrated electric field to perform quality checks on other, production-line microchips. The diagnostic chip consists of two semi-circular arcs of diameter 5.0 mm, separated by a tiny insulating gap, so that together they form a circle. When properly biased in the test circuit, the top are will develop a uniformly-distributed positive charge, and the bottom are will develop an equal but opposite charge (see schematic below). When biased, the probe point at the center of the circular cutout experiences a field of magnitude 25 mN/C. You wonder how many electrons were transferred from the top arc to the bottom, in order to generate such a field. Instructions:
A. Formulate a specific physics problem that will answer the question posed. Include a visual representation of the situation described, with all physical quantities represented by symbolic variables.
B. Identify the concepts that will be needed to answer the question posed, as well as any simplifying assumptions that you will use.